Proceedings of the Seminar on Waveform Recorder Measurement Needs and Techniques for Evaluation/Calibration, Held in Boulder, CO, Oct. 15, 1981,

Proceedings of the Seminar on Waveform Recorder Measurement Needs and Techniques for Evaluation/Calibration, Held in Boulder, CO, Oct. 15, 1981,

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Key words: analog-to-digital converter; digitizer; dynamic testing; effective number of bits; frequency domain; ... Introduction One method for the dynamic testing of waveform recorders and fast analog-to-digital converters is to apply a periodic ... Using the measurement approach indicated in figure 1, the S/N ratio can be calculated from the digital output code using either frequency or time domain analysis.


Title:Proceedings of the Seminar on Waveform Recorder Measurement Needs and Techniques for Evaluation/Calibration, Held in Boulder, CO, Oct. 15, 1981,
Author: Robert A. Lawton
Publisher: - 1982
ISBN-13:

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